CP wafer testing FT finished product testing Equipment and R&D capability iFab Smart Factory
CP wafer testing capability

CP wafer testing capability

Test environment:CLASS 1000

Test machine:J750EX/HD, 3380P, DMX, 93K, STS T4

Probe table:TSK, OPUS

Temperature range:-45℃~135℃

Wafer Size:6 inches, 8 inches, 12 inches

Special specifications:Supports special tests for wafer, broken wafer, MPW wafer, etc

Test products:Digital, analog, digital-analog hybrid, RF, high-speed interface, MCU and other integrated circuits



Add: No. 158, Ji 'an South Road, National High-tech Industrial Development Zone, Yangzhou, Jiangsu, China